Wayland Additive Limited
Wayland Additive can boast a combined 150+ years of industrial electron beam manufacturing expert……...
The S neox fulfills the need for utmost flexibility in an integrable sensor and is, therefore, the most versatile industrial system that is commercially available.
FOV (single shot) > 6.7× 5.6 mm
Acquisition time 3s
Optical resolution < 148 nm
System noise < 0.01 nm
Image Credit: Sensofar Metrology
Extreme Versatility with High Performance
The S neox pushes versatility to the extreme: with 4-in-1 technology, offering unprecedented adaptability for shifty application needs and the best measurement flexibility on any surface.
The re-design of a few algorithms has helped increasethe capability and speed of all technologies. Therefore, the option to add a piezoelectric Z motor makes the S neox the main performer. The S neox covers thicknesses measurements ranging from 50 nm to 5 mm.
Image Credit: Sensofar Metrology
Objective Lens
Table 1. Source: Sensofar Metrology
Brightfield | Interferometry | |||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|
MAG | 5X | 10X | 20X | 50X | 100X | 150X | 2.5X | 5X | 10X | 20X | 50X | 100X |
NA | 0.15 | 0.30 | 0.45 | 0.80 | 0.90 | 0.95 | 0.075 | 0.13 | 0.30 | 0.40 | 0.55 | 0.70 |
WD (mm) | 23.5 | 17.5 | 4.5 | 1.0 | 1.0 | 0.2 | 10.3 | 9.3 | 7.4 | 4.7 | 3.4 | 2.0 |
FOV1 (µm) | 3378x2826 | 1689x1413 | 845x707 | 338x283 | 169x141 | 113x94 | 6756x5652 | 3378x2826 | 1689x1413 | 845x707 | 338x283 | 169x141 |
Spatial sampling2 (µm) | 1.38 | 0.69 | 0.34 | 0.13 | 0.07 | 0.05 | 2.76 | 1.38 | 0.69 | 0.34 | 0.13 | 0.07 |
Optical resolution3 (µm) | 0.94 | 0.47 | 0.31 | 0.18 | 0.16 | 0.148 | 1.87 | 1.08 | 0.47 | 0.35 | 0.26 | 0.20 |
System noise4 (nm) | 100 | 30 | 8 | 5 | 3 | 1 | PSI/ePSI 0.1 nm (0.01 nm with PZT) CSI 1 nm | |||||
Maximum slope5 (º) | 9 | 17 | 27 | 44 | 64 | 72 | 4 | 7 | 17 | 24 | 33 | 44 |
System Specifications
Table 2. Source: Sensofar Metrology
. | . |
---|---|
Measuring principle | Confocal, PSI, ePSI, CSI, Ai Focus Variation and Thin Film |
Measurement types | Image, 3D, 3D thickness, profile and coordinates |
Camera | 5Mpx: 2448x2048 pixels (60 fps) |
Confocal frame rate | 60 fps (5Mpx); 180 fps (1.2 Mpx) |
Vertical scan range coarse | Linear stage: 40 mm range; 5 nm resolution |
Vertical scan range fine | Piezoelectric scanner with capacitive sensor: 200 µm range; 1.25 nm resolution |
Max. Z measuring range | PSI 20 µm; CSI 10 mm; Confocal & Ai Focus Variation 34 mm |
LED light sources | Red (630 nm); green (530 nm); blue (460 nm) and white (575 nm; center) |
Nosepiece | 6 position fully motorized |
Sample reflectivity | 0.05 % to 100% |
Advanced Software Analysis | Inc: SensoVIEW; Op: SensoPRO, SensoMAP |
Software communication | DLL (C++ or C#, Windows 10® - 64 bits)XML (any operating system) |
Computer | Latest INTEL processor |
Operating system | Microsoft Windows 10®, 64 bit |
Cable Length | 5 or 10 m |
Environment | Temperature 10 ºC to 35 ºC; Humidity <80 % RH; Altitude <2000 m |
1 Maximum field of view with 3/2” camera and 0.5X optics. 2 Pixel size on the surface. 3 L&S: Line and Space, half of the diffraction limit according to the Rayleigh criterion. Spatial sampling could limit the optical resolution for interferometric objectives. Values for blue LED. 4 System noise measured as the difference between two consecutive measures on a calibration mirror placed perpendicular to the optical axis. For interferometry objectives, PSI, 10 phase averages. The 0.01 nm are achieved with Piezo stage scanner and temperature-controlled room. Values for green LED (white LED for CSI). Values obtained in a VC-E vibration environment. 5 On smooth surfaces. Up to 86° on rough surfaces.
Dimensions
Image Credit: Sensofar Metrology
Wayland Additive can boast a combined 150+ years of industrial electron beam manufacturing expert……...
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