Image Metrology A/S

Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy".

Our mission is to provide our customers with state-of-the-art image processing software for microscopy including:

Correction tools for creating the most accurate presentation of the "true" surface

Automated analysis techniques assuring high accuracy, quality and cost efficiency

Visualization and reporting tools enabling convincing and impressive communication of results

This mission is fulfilled by development of our main product the Scanning Probe Image Processor, SPIP™. SPIP™ supports a wide variety of microscope types and their file formats including Scanning Probe Microscopes (SPM), interference microscopes, Scanning Electron Microscopes (SEM), confocal microscopes and profilers.