IM4000: An Ion Milling System

Hitachi’s IM4000Plus broad Ar⁺ ion milling system (BIB) helps users to cross-section or polish hard, porous, composite, softand heat sensitive materials with seamless results.

Reliable High-Performance Milling

High current Ar⁺ beam provides quick and reliable cross-sectioning

Stable low kV (<1 kV) capability provided for sensitive materials

Final polishing, for example, for EBSD, with low angle milling (FlatMilling), or for contrasting by high angle milling (relief milling), in a matter of few minutes

Image Credit: Hitachi High-Tech Europe

Easy Specimen Handling

Ex-situ alignment of sample and mask makes installation easy and rapid

Load resin fitted samples measuring up to 25 mm in height and 50 mm in diameter for final polishing

Users can readjust milling position at all times without the need to remount the sample

Simple Operation and Maintenance

Simple and least parameter settings available for any type of application or sample

Easy setup and maintenance with a single ion beam gun

Constant high intensity ion beam throughout the complete voltage range, with independent ionization and acceleration voltages

Easy End-Point Detection

Users can note milling in real time with the help of stereomicroscope

Extendibility

Users can add cryo cooling for heat sensitive materials

Vacuum transfer can be added for oxidation sensitive specimens

Ion Milling System IM4000Play

Video Credit: Hitachi High-Tech Europe

Image Credit: Hitachi High-Tech Europe

Image Credit: Hitachi High-Tech Europe

Image Credit: Hitachi High-Tech Europe

Image Credit: Hitachi High-Tech Europe

Image Credit: Hitachi High-Tech Europe