MarVision Workshop Measuring Microscope MM 320 with M3 Software
Mahr’s MarVision workshop measuring microscope MM 320 with M3 software is designed to handl……...

IEM 10
The IEM 10 from Inovenso has the following features:
Auto stage: X, Y, T Axis
Click and move stage control
Magnification up to x 100,000
High definition image : 5120 X 3840 Pixel
Auto function: filament memory, focus, brightness, contrast
Specifications
Magnification: x20 ~ x100,000 (Efficient: ~x50,000)
Acc Voltage: 1 ~ 30 kV (1 kV increments)
Electron Gun: Tungsten Filament (W)
Detector: SE Detector
Stage: Auto Stage (X: 35 mm,Y: 35 mm,T: 0 to 45o) Manual Stage (Z: 5 to 50 mm)
Image Shift: X, Y, R (Rotation)
Operating System: Microsoft Windows 7
Dimensions (mm): 400(W) x 600(L) x 550(H)
Dimensions (inch): 15,74(W) x 23,62(L) x 21,65(H)
Weight: 85(kgs) - 187 (lbs)
Stage Position
Users can effortlessly locate the sample on the stage.

Click and Move
By applying the auto stage, stage is controlled easily with a mouse click.

Auto Focus and Fine Focus
Auto focus function allows easy operation and clearer images can be obtained even at the greater magnifications.
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Filament Memory
Filament’s saturation point is automatically stored and then activated.

IEM 10+
The IEM 10+ from Inovenso has the following features:
Auto stage: X, Y, T Axis
Click and move stage control
Magnification up to x 100,000
High definition image: 5120 X 3840 Pixel
Thermo EDS Detector: 133 eV at Mn, B(5) ~ U(92)
Auto function: filament memory, focus, brightness, contrast

Specifications
Electron Gun: Tungsten Filament (W)
Detector: SE and EDS Detectors
Stage: Auto Stage (X: 35 mm,Y: 35 mm,T: 0 to 45o) Manual Stage (Z: 5 to 50 mm)
Magnification: x20 ~ x100,000 (Efficient: ~x50,000)
Acc Voltage: 1 ~ 30 kV (1 kV increments)
Image Shift: X, Y, R (Rotation)
Operating System: Microsoft Windows 7
Weight: 95(kgs) - 210(lbs)
Dimensions (mm): 400(W) x 600(L) x 550(H)
Dimensions (inch): 15,74(W) x 23,62(L) x 21,65(H)
Rapid EDS Analysis
Point and shoot analysis with NORAN System 7 software uses standardless quantitative analysis to allow rapid identification of different regions within a material.
Extracted Linescans


Extracted Area Analysis




| Point #1 | Point #2 | Point #3 | |
|---|---|---|---|
| C-K | 2.1 | 2.2 | 1.9 |
| O-K | 58.3 | 61.8 | 61.3 |
| Mg-K | 0.7 | ||
| Al-K | 12.6 | 1.1 | 0.5 |
| Si-K | 18.3 | 6.7 | 33.9 |
| K-K | 4.2 | 0.1 | 0.1 |
| Co-K | 0.1 | ||
| Fe-K | 3.7 | 27.0 | 2.3 |
| Cu-K | 0.9 | ||
| Weight percentages |
EDS Analysis with NORAN
System 7 Spectral Imaging
The UltraDry Compact EDS detector provides exceptional elemental mapping within just a few minutes. With Spectral Imaging, where a complete EDS spectrum is stored at every pixel, samples can be analyzed after they are removed from the microscope. NORAN System 7 tools offer a number of analytical methods for the best results.
Mahr’s MarVision workshop measuring microscope MM 320 with M3 software is designed to handl……...
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