ICPE-9800 Simultaneous ICP Atomic Emission Spectrometer Series

The ICPE-9800 Series of simultaneous ICP atomic emission spectrometers are advanced systems designed for rapid analysis of multiple elements with high accuracy, irrespective of their concentration levels. They are equipped with a vertically oriented torch that reduces sample adhesion on the torch walls, thereby alleviating memory effects.

The axial view of the ICPE-9800 series includes a photometric separation unit fixed at right angles to the torch. The presence of a user-friendly software enables dual analysis of samples by switching between axial and radial view. A large 1in CCD sensor is used for capturing data for all wavelengths in the form of an image on a 2D plane. Further, a Schmidt mirror is provided for correcting astigmatism.

Key Features

The main features of the ICPE-9800 Series include:

High performance and high resolution

Simultaneous analysis of trace and high-concentration samples

Leading-edge CCD detector records data of all wavelengths

Sample introduction system facilitates stable analysis for a long period of time

Anti-blooming characteristics

Automatic shutdown of system after analysis

Reduced startup gas consumption

Applications

The key applications of the ICPE-9800 Series are:

Food industry

Environmental applications

Pharmaceuticals and chemicals

Metal industry

Cost-Reducing Features

The ICPE-9800 system includes three major features that reduce usage of argon gas to half of normal levels, thereby saving significant amount of costs. These features include:

The mini-torch system consumes just half the amount of argon gas used by conventional torches

Eco Mode automatically reduces the rate of plasma gas flow during the standby mode

There is no need to purge the vacuum spectrometer continuously with high-purity nitrogen or argon gas

ICPEsolution Software

The ICPEsolution software is a user-friendly and 21 CFR compliant software that helps users to optimize techniques with:

Diagnosis Assistant

Automatic Wavelength Selection

Method Development Assistant