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Hysitron PI SEM 89 PicoIndenter—For Quantitative In-Situ Nanomechanics
Bruker’s Hysitron PI Series PicoIndenters make in-situ mechanical research in the scanning electron microscope (SEM) or transmission electron microscope (TEM) simple. With variations designed to complement most microscope brands, users are sure to find one ideal for their research.
Image Credit: Bruker Nano Surfaces and Metrology
Hysitron PI 89 SEM PicoIndenter
Advanced versatility for testing in extreme environments
Accurate quantitative nanoscale mechanical characterization by direct observation, with up to 3.5 N load and 150 µm displacement
Encoded XYZ sample location, a solid mechanical design, a flexible platform, and a lower weight
The whole range of testing methods, such as 1000 °C heating, cryogenic temperature, scratch, electrical characterization, scanning probe microscopy (SPM) imaging, XPM property mapping, fatigue/nanoDynamic, and others, are supported by modular design
Image Credit: Bruker Nano Surfaces and Metrology
The PI 89 offers outstanding environmental control and enables researchers to do in-situ nanomechanical testing within an SEM with very low to high stresses. The system yields industry-leading force and displacement resolutions and expanded force and displacement ranges, thanks to the integration of a high-performance controller from Bruker, a patented capacitive transducer, and intrinsic displacement control flexure technology.
The modular architecture also enables a wide range of testing techniques for further improvements, including heating and scratch testing.
Image Credit: Bruker Nano Surfaces and Metrology
SEM PicoIndenter Specifications. Source: Bruker Nano Surfaces and Metrology
| Feature | Hysitron PI 85E | Hysitron PI 89 / PI 89 Auto |
|---|---|---|
| Max Force | 10 mN; 250 mN | 10 mN; 500 mN; >3.5 N (300 mN max load for PI 89 Auto) |
| Force Noise Floor* (inside an SEM, 60 Hz) | <0.4 μN; <5 μN | <0.4 μN; <5 μN; 30 μN |
| Force Noise Floor (in ideal environment, 60 Hz, 10 mN transducer) | <50 nN | <50 nN |
| Max Displacement | 5 μm; 100 μm | 5 μm; 150 μm |
| Displacement Noise Floor* (inside an SEM, 60 Hz) | <1 nm | <1 nm |
| Displacement Noise Floor (in ideal environment, 60 Hz, 10 mN transducer) | <0.1 nm | <0.1 nm |
| Feedback Control Rate | 78 kHz | 78 kHz |
| Max Data Acquisition Rate | 39 kHz | 39 kHz |
| Sample Positioning Range | >3 x 3 mm (XY, in sample plane); 20 mm (Z, manual) | 12 x 26 mm (XY); 29 mm (Z) |
*Guaranteed on install.
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