Hysitron PI SEM 89 PicoIndenter—For Quantitative In-Situ Nanomechanics

Bruker’s Hysitron PI Series PicoIndenters make in-situ mechanical research in the scanning electron microscope (SEM) or transmission electron microscope (TEM) simple. With variations designed to complement most microscope brands, users are sure to find one ideal for their research.

Image Credit: Bruker Nano Surfaces and Metrology

Hysitron PI 89 SEM PicoIndenter

Advanced versatility for testing in extreme environments

Accurate quantitative nanoscale mechanical characterization by direct observation, with up to 3.5 N load and 150 µm displacement

Encoded XYZ sample location, a solid mechanical design, a flexible platform, and a lower weight

The whole range of testing methods, such as 1000 °C heating, cryogenic temperature, scratch, electrical characterization, scanning probe microscopy (SPM) imaging, XPM property mapping, fatigue/nanoDynamic, and others, are supported by modular design

Hysitron PI SEM 89 PicoIndenter—For Quantitative In-Situ Nanomechanics

Image Credit: Bruker Nano Surfaces and Metrology

The PI 89 offers outstanding environmental control and enables researchers to do in-situ nanomechanical testing within an SEM with very low to high stresses. The system yields industry-leading force and displacement resolutions and expanded force and displacement ranges, thanks to the integration of a high-performance controller from Bruker, a patented capacitive transducer, and intrinsic displacement control flexure technology.

The modular architecture also enables a wide range of testing techniques for further improvements, including heating and scratch testing.

Hysitron PI SEM 89 PicoIndenter—For Quantitative In-Situ Nanomechanics

Image Credit: Bruker Nano Surfaces and Metrology

SEM PicoIndenter Specifications. Source: Bruker Nano Surfaces and Metrology

Feature	Hysitron PI 85E	Hysitron PI 89 / PI 89 Auto
Max Force	10 mN; 250 mN	10 mN; 500 mN; >3.5 N (300 mN max load for PI 89 Auto)
Force Noise Floor* (inside an SEM, 60 Hz)	<0.4 μN; <5 μN	<0.4 μN; <5 μN; 30 μN
Force Noise Floor (in ideal environment, 60 Hz, 10 mN transducer)	<50 nN	<50 nN
Max Displacement	5 μm; 100 μm	5 μm; 150 μm
Displacement Noise Floor* (inside an SEM, 60 Hz)	<1 nm	<1 nm
Displacement Noise Floor (in ideal environment, 60 Hz, 10 mN transducer)	<0.1 nm	<0.1 nm
Feedback Control Rate	78 kHz	78 kHz
Max Data Acquisition Rate	39 kHz	39 kHz
Sample Positioning Range	>3 x 3 mm (XY, in sample plane); 20 mm (Z, manual)	12 x 26 mm (XY); 29 mm (Z)

*Guaranteed on install.

标签：Scanning Electron Microscopes (SEM)

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