Hysitron PI 89 SEM PicoIndenter—Advanced Versatility for Testing in Extreme Environments

With the Hysitron PI Series PicoIndenters, Bruker makes it simple to conduct in-situ mechanical studies in the scanning electron microscope (SEM) or transmission electron microscope (TEM). Users are guaranteed to discover an idealsolutionfor their study with options built to match most microscope brands.

Image Credit: Bruker Nano Surfaces and Metrology

Hysitron PI 89 SEM PicoIndenter

Advanced versatility for testing in extreme environments

Absolute quantitative nanoscale mechanical characterization by direct observation, with up to 3.5 N load and 150 µm displacement

Encoded XYZ sample location, a strong mechanical design, a flexible platform, and a lighter weight

The comprehensive array of testing methodologies, including 1000 °C heating, cryogenic temperature, scratch, electrical characterization, scanning probe microscopy (SPM) imaging, XPM property mapping, fatigue/nanoDynamic, and more, are supported by a modular design

Image Credit: Bruker Nano Surfaces and Metrology

The PI 89 allows researchers to conductin-situ nanomechanical testing inside an SEM from extremely low to high loads whileproviding exceptional environmental control. The system combines Bruker’s high-performance controller with a proprietary capacitive transducer and intrinsic displacement control flexure technology. This results in industry-leading force and displacement resolutions and increased force and displacement ranges.

The modular architecture also enables various testing methodologies for future upgrades, such as heating and scratch testing.

Image Credit: Bruker Nano Surfaces and Metrology

SEM PicoIndenter Specifications. Source: Bruker Nano Surfaces and Metrology

*Guaranteed on install.