High Precision Solutions for Cleanliness Analysis

Determining precise measurements of particle contamination is imperative in both the manufacturing and pharmaceutical industries, as the potential damage that can result from this contamination can harmfully effect both the machinery and efficacy of pharmaceutical products.

To resolve this dilemma, Clemex offers customers the PSFilter, which has been specifically designed to analyze particle contamination by measuring the presence of these unwanted particles that are found on membrane filters, wafers, tape lifts or gel packs. Following particle analysis, the Clemex PSFilter provides users with statistically significant and reproducible data through the use of its image analysis technology.

The types of analytical procedures that can be performed by the Clemex PSFilter include, but are not limited to:

Microparticles or micro-organisms filtered through a liquid

Witness plates that have retained airborne particles in cleanrooms

Evaluate tape lifts for the presence of unwanted particles or fungal spores present in the surrounding environment

Evaluation of Gel-Paks used in the aeronautics industry

Product Features

Rapid analysis procedure

The PSFilter produces a large number of images, classifies particulates and generates an easily reproducible report in only a few minutes

All data results can be used for documentation and presentation purposes

Provides detailed results on particle sizes

Macroscopic results: > 5 microns

Microscopic results: > 0.5 microns

High-resolution USB II Camera

Intuitive interface

Robust report

Installation and training on the system can be provided in the lab

Conforms to various international standards, of which include:

USP 788

ISO 4406 & 4407

ISO 1 6232

IEST STD CC1246D

Additional customization available as needed by the user

Provides combined data on a single sheet

Provides important information on a wide range of particle sizes

When multiple particle types are present, the PSFilter scans samples twice; initially at a higher magnification and then at a lower magnification to combine the results from both analyses on a single data sheet.

Wide range of particle types are detected with varying characteristics including:

Size

Morphology

Color

Elevation

Composition

Automated shading corrector

Ensures that even illumination is present in all images

Unlimited number of calibration settings available

Autoexposure

Automatically adjusts camera lighting

Object tracking

Allows users to validate measurements

Eliminates any potential artifacts found during analysis

Contrast Thresholding

Allows for transparent objects to be effectively detected and analyzed

Up to 6 samples can be run at any given time without requiring any user intervention

Each sample will have its own set of raw data and measurement results

Data browser allows the user to select objects and send them to a different category for separate analysis if necessary

Adjacent objects can be separated if individual measurements are required

Circular stage patterns available for filters and wafer analysis

Camera and microscope can be easily controlled with integrated software

High Precision Solutions for Cleanliness Analysis

High Precision Solutions for Cleanliness Analysis - Picture 1High Precision Solutions for Cleanliness Analysis - Picture 2High Precision Solutions for Cleanliness Analysis - Picture 3High Precision Solutions for Cleanliness Analysis - Picture 4High Precision Solutions for Cleanliness Analysis - Picture 5Image map