High-Performance AFM for Nanoscale Imaging

The Nano-Observer II is a state-of-the-art atomic force microscope (AFM) that blends remarkable performance, adaptability, and ease of use. It provides a broad range of nanoscale imaging and characterization capabilitiesand is intended for beginnerto expert users.

Nano-Observer II: Revolutionizing Nanoscale Research with Advanced AFM TechnologyPlay

Video Credit:CSInstruments

Download the Brochure for More Information

Key Features

AutoScan Software: Easier and Faster Automated Scanning

Three clicks will produce high-quality images

Electronic control and automated setup for easier operation

Detailed features and parameter configurations for more experienced users

User-Friendly Design

Compact AFM head with pre-positioned tip system

Simple optical path and sample access

Effective pre-approach process via top and side views of tip/sample area

Advanced Technology Integration

Low-noise USB controller (24-bit)

Low noise integrated lock-in features forimprovedphase detection, EFM/MFM/KFM, orpiezoresponse force microscopy(PFM)

Advanced imaging modes include HD-KFM, ResiScope, and Soft Intermittent Contact (Soft-IC)

High-Performance Scanning

High-resolution, low-noise scanning capabilities

Large-small area scans without changing the scan head

Consistent resolution across all scan sizes

Advanced Modes

ResiScope^™ III

Electrical resistance is measured across 10 orders of magnitude (10²to 10¹²ohms)

High sensitivity for in-depth examination of the electrical characteristics of materials

Applications in advanced materials science, semiconductors, and photovoltaics

Sample: Polymer battery. Mode: Soft ResiScope. Scan size: 60 µm. Signal: Current from 2 pA to 3 µA. Image Credit: CSInstruments

HD-KFM^™ III (High Definition Kelvin Force Microscopy)

Establishes new standardsfor mapping surface potential

Increased spatial resolution and sensitivity

Perfect for polymers, semiconductors, and 2D materials

Sample: Graphene. Mode: HD-KFM. Scan size: 20 µm. Image Credit: CSInstruments

Sample: Metallic structure embedded on epoxy. Mode: 1. Topography 2. HD-KFM dC/dZ. Scan size: Image Credit: CSInstruments

Soft IC Mode-The 3rdAFM Mode

Combines the dynamic potential of resonant modes with the accuracy of contact AFM

Suitable for soft and delicate materials

Extensive electrical and mechanical measurements with little sample disruption

Includes Soft Meka, Soft PFM, Soft ResiScope, and Soft SThM

Soft MEKA

Soft IC mode extension for accurate mechanical property measurements

High-resolution mapping of adhesion and stiffness

Highly beneficial for soft or fragile samples

Soft PFM

Combines Soft IC and PFM

Concurrent electrical and mechanical measurements

Excellent for thorough material analysis with little effect on the sample

Soft SThM Mode

Soft IC mode extension for accurate thermal property measurements

Application Fields

Photovoltaics

Electrochemistry

Corrosion Studies

Nanomechanical Analysis

Materials Science

Semiconductor Research

Polymer Studies

Biological Samples

2D Materials Characterization

Download the brochure to learn more