FD Cyclones from Camfil Farr Air Pollution Control
These high efficiency cyclones are frequently used as product receivers, as precleaners to high e……...
The Nano-Observer II is a state-of-the-art atomic force microscope (AFM) that blends remarkable performance, adaptability, and ease of use. It provides a broad range of nanoscale imaging and characterization capabilitiesand is intended for beginnerto expert users.
Nano-Observer II: Revolutionizing Nanoscale Research with Advanced AFM Technology
Video Credit:CSInstruments
Download the Brochure for More Information
Key Features
AutoScan Software: Easier and Faster Automated Scanning
Three clicks will produce high-quality images
Electronic control and automated setup for easier operation
Detailed features and parameter configurations for more experienced users
User-Friendly Design
Compact AFM head with pre-positioned tip system
Simple optical path and sample access
Effective pre-approach process via top and side views of tip/sample area
Advanced Technology Integration
Low-noise USB controller (24-bit)
Low noise integrated lock-in features forimprovedphase detection, EFM/MFM/KFM, orpiezoresponse force microscopy(PFM)
Advanced imaging modes include HD-KFM, ResiScope, and Soft Intermittent Contact (Soft-IC)
High-Performance Scanning
High-resolution, low-noise scanning capabilities
Large-small area scans without changing the scan head
Consistent resolution across all scan sizes
Advanced Modes
ResiScope™ III
Electrical resistance is measured across 10 orders of magnitude (102to 1012ohms)
High sensitivity for in-depth examination of the electrical characteristics of materials
Applications in advanced materials science, semiconductors, and photovoltaics
Sample: Polymer battery. Mode: Soft ResiScope. Scan size: 60 µm. Signal: Current from 2 pA to 3 µA. Image Credit: CSInstruments
HD-KFM™ III (High Definition Kelvin Force Microscopy)
Establishes new standardsfor mapping surface potential
Increased spatial resolution and sensitivity
Perfect for polymers, semiconductors, and 2D materials
Sample: Graphene. Mode: HD-KFM. Scan size: 20 µm. Image Credit: CSInstruments
Sample: Metallic structure embedded on epoxy. Mode: 1. Topography 2. HD-KFM dC/dZ. Scan size: Image Credit: CSInstruments
Soft IC Mode-The 3rdAFM Mode
Combines the dynamic potential of resonant modes with the accuracy of contact AFM
Suitable for soft and delicate materials
Extensive electrical and mechanical measurements with little sample disruption
Includes Soft Meka, Soft PFM, Soft ResiScope, and Soft SThM
Soft MEKA
Soft IC mode extension for accurate mechanical property measurements
High-resolution mapping of adhesion and stiffness
Highly beneficial for soft or fragile samples
Soft PFM
Combines Soft IC and PFM
Concurrent electrical and mechanical measurements
Excellent for thorough material analysis with little effect on the sample
Soft SThM Mode
Soft IC mode extension for accurate thermal property measurements
Application Fields
Photovoltaics
Electrochemistry
Corrosion Studies
Nanomechanical Analysis
Materials Science
Semiconductor Research
Polymer Studies
Biological Samples
2D Materials Characterization
Download the brochure to learn more
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