High Definition in Automated Microhardness Testing

The Clemex CMT line of hardness testing solutions can be made available as single or dual solutions that can be used for both macro- and micro-hardness testing, depending upon the specific needs of the customer. By providing the user with a macro view of the entire sample and its annotation tools, this system of testing solutions provides position indents at the precise location that they are needed.

Product Features

High definition camera

Allows users to measure indents at a remarkable precision rate, regardless of the type of surface being analyzed

Provides highly reproducible results

Provides users with unique sample characteristics, some of which include:

Grain size

Phase area percentage

Coating thickness

All loads are applied using dead weights of a consistent mass

Autonomous system

Minimizes any potential for human error

Automatically calibrated through invariant dimensional calibration

Increased reliability

Auto-focusing technology

Can function unattended for hours

Increases throughput and productivity

Built-in validation technology can be run and predetermined dates and times

All measurements are automatically stored in the Results Window

Compliant with the following international standards:

ASTM E 384

DIN/ISO 6507

Equipped with Clemex Vision Lite and its 4 modules

Allows the tester to act as an image analysis system

Image resolution: 1.3 megapixels

300% greater as compared to leading competitors

Produces the sharpest and finest details

Accurate Indent Detection

Reference circle allows users to easily indent the edges of curved or irregular samples

This system can also rotate traverses to ensure they are perpendicular to the edge

Automatic z-repositioning

Particularly useful during the indentation of a multi-level sample

High Definition in Automated Microhardness Testing

High Definition in Automated Microhardness Testing - Picture 1High Definition in Automated Microhardness Testing - Picture 2Automatic detection of indent on etched sample