Homasote Company
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High Definition in Automated Microhardness Testing
The Clemex CMT line of hardness testing solutions can be made available as single or dual solutions that can be used for both macro- and micro-hardness testing, depending upon the specific needs of the customer. By providing the user with a macro view of the entire sample and its annotation tools, this system of testing solutions provides position indents at the precise location that they are needed.
Product Features
High definition camera
Allows users to measure indents at a remarkable precision rate, regardless of the type of surface being analyzed
Provides highly reproducible results
Provides users with unique sample characteristics, some of which include:
Grain size
Phase area percentage
Coating thickness
All loads are applied using dead weights of a consistent mass
Autonomous system
Minimizes any potential for human error
Automatically calibrated through invariant dimensional calibration
Increased reliability
Auto-focusing technology
Can function unattended for hours
Increases throughput and productivity
Built-in validation technology can be run and predetermined dates and times
All measurements are automatically stored in the Results Window
Compliant with the following international standards:
ASTM E 384
DIN/ISO 6507
Equipped with Clemex Vision Lite and its 4 modules
Allows the tester to act as an image analysis system
Image resolution: 1.3 megapixels
300% greater as compared to leading competitors
Produces the sharpest and finest details
Accurate Indent Detection
Reference circle allows users to easily indent the edges of curved or irregular samples
This system can also rotate traverses to ensure they are perpendicular to the edge
Automatic z-repositioning
Particularly useful during the indentation of a multi-level sample
High Definition in Automated Microhardness Testing
High Definition in Automated Microhardness Testing - Picture 1High Definition in Automated Microhardness Testing - Picture 2
Automatic detection of indent on etched sample
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