HF5000: A Cold Field Emission Transmission Electron Microscope

The HF5000 from Hitachi is a 200 kV aberration-corrected CFE TEM or STEM. It provides a robust blend of atomic-resolution imaging and analysis in combination with extensive automation and sophisticated in-situ capabilities.

Imaging Performance

The power of atomic resolution SE imaging can be used with HAADF/ADF/BF in parallel

Any user can achieve quality results with the help of the completely automated C_s corrector (or users can take entire manual control whenever they wish to)

Field-free imaging of magnetic samples available in TEM and STEM mode

Users can make use of Ptychography and 4D STEM to get the most out of their sample

Image Credit: Hitachi High-Tech Europe

Analytical Performance

Maximum EELS performance provided with the help of high brightness, narrow-energy CFE gun

High throughput, high sensitivity EDX available with symmetrically opposed dual SDDs offering >2 sr collection angle

Image Credit: Hitachi High-Tech Europe

Powerful Automation

Users can program their workflows and recipes in Python for regular tasks, tomography, high speed acquisition, or the most complicated in-situ experiments

Users have the option to combine multi-platform control systems and datasets into an individual timeline with the help of Azorus open-source software

Advanced In-Situ Capabilities

Users can carry out in-situ and operando experiments with gas, liquid, heating, biasing and electrochemistry holders

Customized holder design service guarantees that users can perform precisely the experiment they require

Users can view in-situ reactions of gases with surfaces by utilizing the SE detector

Image Credit: Hitachi High-Tech Europe