Helios 5 DualBeam - Advanced S/TEM and APT sample preparation, subsurface and 3D Characterization

Building upon the industry-leading Helios DualBeam family’s high-performance imaging and analysis capabilities, Thermo Scientific has introduced the Helios 5 DualBeam. It is meticulously designed to satisfy the requirements of material science researchers and engineers for a variety of focused ion beam scanning electron microscopy (FIB-SEM) use cases, even with the most difficult samples.

TheHelios 5 DualBeam redefines the standard in high-resolution imaging with high material contrast; easy, rapid, precise, and high-quality sample preparation for S/TEM imaging and atom probe tomography (APT); and high-qualitysubsurface and 3D characterization.

Additional improvements to the new Helios 5 DualBeam were made to ensure that the system is optimized for a range of manual or automated workflows, building on the established capabilities of the Helios DualBeam family. Among these enhancements are:

Greater ease-of-use: For operators of all skill levels, the Helios 5 DualBeam is the most user-friendly DualBeam. Months of operator training can be cut down to a few days. All operators would benefit from the system’s design, enabling the production ofreliable, repeatable results on a wide range of complex applications.

Increased productivity: By enabling unattended and even overnight operation, the Thermo Scientific AutoTEM 5 and Helios 5 DualBeam software’s enhanced automation capabilities, increased robustness, and stability enhancements can greatly increase the throughput of sample preparation.

Improved time to results: Now available on the Helios 5 DualBeam is FLASH, itis a novel approach to image tuning. With traditional microscopes, the microscope must be meticulously adjusted through repeated alignments each time a user needs to capture an image. With the Helios 5 DualBeam, a simple gesture across the screen will activate FLASH. This automatically modifies these parameters. The automatic modifications can greatly increase data quality, improve throughput, and simplifythe process of obtaining high-quality pictures.

S/TEM Sample Preparation

The fifth generation of the industry-leading Helios DualBeam family includes the Thermo Scientific Helios 5 DualBeam. It is meticulously crafted to satisfy the demands of scientists and engineers, combiningthe superior Thermo Scientific Tomahawk Ion Column for quick, simple, and accurate high-quality sample preparation with the cutting-edge Elstar electron column for extremely high-resolution imaging.

The Helios 5 DualBeam is equipped with a suite of cutting-edge technologies, including advanced electron and ion optics, to facilitate consistent and easy high-resolution S/TEM and atom probe tomography (APT) sample preparation. This allows for high-quality subsurface and 3D characterization, even on the most difficult samples.

Key Features

High-Quality Sample Preparation

Site-specific sample preparationfor S/TEM and APT analysis utilizingthe industry-leading low-voltage performance of the Thermo Scientific Phoenix Ion Column or the high-throughput Thermo Scientific Tomahawk Ion Column.

Shortest Time to Nanoscale Information

Using the best-in-class Thermo Scientific Elstar Electron Column with FLASH and SmartAlign technologies, this column is suitable for users of any experience level.

Complete Sample Information

The contrast obtained from up to six integrated in-column and below-the-lens detectors is sharp, refined, and free of charge.

Rapid Nanoprototyping

Accurate, precise, and rapid milling and depositing of complex structures with critical dimensions of under10 nm.

Artifact-Free Imaging

Based on integrated sample cleanliness management and specialized imaging modes like DCFI andSmartScan Modes.

Fully Automated

AutoTEM 5 Software is an optional tool that facilitates quick,simple, fully automated, unsupervised, multi-site in situ and ex situ TEM sample preparation and cross-sectioning.

Next-Generation UC+ Monochromator Technology

With the next generation of UC+ monochromator technology, which has a higher current and can achieve sub-nanometer performance at low energies, the user can reveal the smallest details.

3D Analysis

Thermo Scientific Auto Slice & View 5 (AS&V5) Software is an optional tool that provides accurate region-of-interest targeting and high-quality, multi-modal subsurface and 3D information.

Precise Sample Navigation

It is customized to meet specific application requirements thanksto the Thermo Scientific Nav-Cam Camera located inside the chamber, the high stability and accuracy of the 150-mm piezo stage, andthe adaptability of the 110-mm stage.

Specifications

Source: Thermo Fisher Scientific – Electron Microscopy Solutions

* Available as an option, configuration dependent