Gunshot Residue Analysis with Phenom ParticleX GSR Desktop SEM

上海仪舶实验室自动化 25-01-23 12:44:58

Gunshot Residue Analysis with Phenom ParticleX GSR Desktop SEM

Gunshot residue (GSR) analysis is a vital process when it comes to determining whether a firearm has been used in a crime. Established GSR analysis techniques are based on ascanning electron microscope (SEM), which is used to scan the sample and find suspect GSR particles. If a suspect particle is found, anenergy dispersive spectroscopy (EDS)technique is then employed to identify the elements in that particle.

The Thermo Scientific Phenom ParticleX GSR Desktop SEM isthe only dedicated SEM specifically designed for gunshot residue analysis. As the system is fully automated, users can speed up the analysis process. There isno need to change the settings each time; users can simply focus on the task at hand.

The desktop Phenom system's central component is a high-brightness CeB6 source. This means that users can rest assured thatit will provide reliable, long-lasting daily use and will not need to be unexpectedly replaced.

The Phenom ParticleX GSR Desktop SEM expedites gunshot residue analysis on-demand, making it easier and more reliable than ever before. Perfect for every busy lab that wants to save time and floor space.

Specialized solution for gunshot residue

It only requires a modest amount of lab space

Stable, round-the-clock operation

Long-lasting CeB6 source

Key Features

Reliable, High Throughput Results

ThePhenom ParticleX GSR Desktop SEM can handle a scan area of 100 mm x 100 mm thanks to the fully motorized stage.

The automation software utilizes the SEM's internal scan control, enhancing beam positioning accuracy. This capability is particularly beneficial when revisiting particles during the GSR verification phase. A standard GSR sample holder can accommodate up to 30 x 12 mm GSR pin stubs, along with the required calibration samples.

Specifications

Source: Thermo Fisher Scientific – Electron Microscopy Solutions

. .
Electron Imaging
  • Long lifetime thermionic source(CeB6)

  • Multiple beam currents

  • Electron imaging magnification range

    160 - 200,000x

    Light imaging magnification

    3-16x

    Resolution

    <10 nm

    Image resolution options

    960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels

    Acceleration voltages

    Default: 5 kV, 10 kV and 15 kV

    Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode

    Vacuum levels

    Low - medium - high

    Detector

    Backscattered electron detector (standard)

    Energy-dispersive X-ray spectroscopy (EDS) detector (standard)

    Secondary electron detector (optional)

    Sample size
  • Max. 100 mm x 100 mm (up to 36x 12 mm pin stubs)

  • Max. 40 mm height (optional up to 65 mm)

  • Sample loading time

    Light optical <5 s

    Electron optical <60 s

    Software Specifications
  • Compliant with ASTM E1588

  • Typically ≥ 98% hit rate on plano artificial GSR sample

  • Supports classification of Pb-free ammunition types

  • Automatic calibrations for reproducible results

  • Reporting workflow
  • Particle relocation, verification and custom report generation

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