Teubert Maschinenbau GmbH
The Teubert Maschinenbau GmbH is a leading manufacturer of machines and accessory parts for proce……...
Gunshot residue (GSR) analysis is a vital process when it comes to determining whether a firearm has been used in a crime. Established GSR analysis techniques are based on ascanning electron microscope (SEM), which is used to scan the sample and find suspect GSR particles. If a suspect particle is found, anenergy dispersive spectroscopy (EDS)technique is then employed to identify the elements in that particle.
The Thermo Scientific Phenom ParticleX GSR Desktop SEM isthe only dedicated SEM specifically designed for gunshot residue analysis. As the system is fully automated, users can speed up the analysis process. There isno need to change the settings each time; users can simply focus on the task at hand.
The desktop Phenom system's central component is a high-brightness CeB6 source. This means that users can rest assured thatit will provide reliable, long-lasting daily use and will not need to be unexpectedly replaced.
The Phenom ParticleX GSR Desktop SEM expedites gunshot residue analysis on-demand, making it easier and more reliable than ever before. Perfect for every busy lab that wants to save time and floor space.
Specialized solution for gunshot residue
It only requires a modest amount of lab space
Stable, round-the-clock operation
Long-lasting CeB6 source
Key Features
Reliable, High Throughput Results
ThePhenom ParticleX GSR Desktop SEM can handle a scan area of 100 mm x 100 mm thanks to the fully motorized stage.
The automation software utilizes the SEM's internal scan control, enhancing beam positioning accuracy. This capability is particularly beneficial when revisiting particles during the GSR verification phase. A standard GSR sample holder can accommodate up to 30 x 12 mm GSR pin stubs, along with the required calibration samples.
Specifications
Source: Thermo Fisher Scientific – Electron Microscopy Solutions
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Electron Imaging |
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Electron imaging magnification range |
160 - 200,000x |
Light imaging magnification |
3-16x |
Resolution |
<10 nm |
Image resolution options |
960 x 600, 1920 x 1200, 3840 x 2400 and 7680 x 4800 pixels |
Acceleration voltages |
Default: 5 kV, 10 kV and 15 kV Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode |
Vacuum levels |
Low - medium - high |
Detector |
Backscattered electron detector (standard) Energy-dispersive X-ray spectroscopy (EDS) detector (standard) Secondary electron detector (optional) |
Sample size |
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Sample loading time |
Light optical <5 s Electron optical <60 s |
Software Specifications |
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Reporting workflow |
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