GRAND-EOS™ - Hyperspectral system for high resolution macro and micro imaging

Photon etc.presents GRAND-EOS, a unique hyperspectral camera suitable for analyzing solar cells and advanced materials in the visible (VIS), near-infrared (NIR), and short-wave infrared (SWIR). Based on Photon etc.’s high-performance tunable imaging filter technology, this hyperspectral imager delivers, both macro- and microscopic, crisp images and detailed spectral data across hundreds of thousands of points across the field of view.

GRAND-EOS not only captures large amounts of spatial and spectral information but also boasts a rapid data acquisition process, thanks to its high filter throughput (unpolarized wavelength selection) and imaging sensor sensitivity. This hyperspectral imaging system offers four essential measurement modalities: transmittance, reflectance, electroluminescence (EL), and photoluminescence (PL). The resulting maps provide researchers with an efficient tool for studying the spatial distribution of defects, constraints, and optoelectronic properties of the new generation of photovoltaic and other advanced materials.

Key Features & Applications

The main features and applications of the GRAND-EOS are:

Field of view compatible with the size of the latest generation of photovoltaic cells

Transmittance, reflectance, photoluminescence, and electroluminescence modalities for defects, impurities, and optoelectronics properties mapping

Uniform illumination to guarantee homogeneous excitation across the entire field of view

Mapping of the spatial distribution of defects, impurities, and variation in material composition;

Characterization of the impact of a material’s micro and macrostructure on carrier generation, recombination, and transport

Fast hyperspectral data acquisition due to high throughput global imaging tunable filter (wavelength scanning - no spatial scanning) and high imaging sensor sensitivity

Continuously tunable from 400 to 1620 nm to cover the spectral responses of a wide range of materials such as perovskites, GaAS, SiC, Si, CIS//GIGS

Custom field of view (micro and macro modes)

Other Applications

Counterfeit examination

Forensic research

Food and plant sorting

Those techniques have already been successfully used to characterize inhomogeneities in CIS and perovskite solar cells.

Specifications

Spectral Range	400 - 1620 nm (reduced 400-1000 nm and 900-1620 nm spectral ranges are also available)
Spectral Resolution	< 4 nm
Wavelength Absolute Accuracy	0.25 nm
Imaging sensor	sCMOS and Photon etc.'sInGaAs camera (ZephIR™ 1.7 or Alizé™ 1.7)
Field of view (customizable)	20 x 20 mm to 210 x 210 mm(other FOV available upon request)
Micro-imaging magnification	5X, 10X
Wavelength Absolute Accuracy	0.25 nm
Software	Computer with PHySpec^TMcontrol and analysis software included with unlimited free licenses
Options & Accessories	Absolute photometric calibration, micro-imaging modality, white light illumination, laser excitation

标签：Materials Characterization Equipment Mechanical Testing

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