Teledyne FLIR Scientific Materials
Back in 1960, researchers were engaged in cutting edge quantum physics aimed at building a &ldquo……...
Gaertner Scientific Corporation
Ellipsometers give non-contact thickness and refractive index measurements of thin transparent and semi transparent films to 1 angstrom or better. Gaertner has helped pioneer the field of ellipsometry and we offer high quality laser ellipsometers that are flexible and upgradeable to meet varied user requirements in the semiconductor, solar cell, bio-chemical, flat panel and other thin film industries.
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