FusionScope® - Integrated AFM, SEM, and EDS

FusionScope is an innovative correlative microscopy platform that integrates AFM measurement techniques, SEM imaging, and EDS elemental analysis.

Download the Brochure for More Information

The FusionScope

Correlative AFM & SEM

3.5–15kV Acc. voltage

Schottky emitter

AFM

Piezoresistive cantilever

Scan range:22² µm(XY)

Scan range:11µm (Z)

Compact Vacuum Chamber:

Pumping time: Less than5 minutes

Joint Coordinate System

Image Credit: Quantum Design, Inc.

Main Benefits of Correlative AFM and SEM Microscopy:

FusionScope is a user-friendly platform that combines the advantages of SEM and AFM.

Accurately position the AFM on your area of interest, even on complex or difficult surfaces.

Conduct a comprehensive analysis of topography, nanomechanics, chemistry, electrical, and magnetic properties using correlative SEM and AFM techniques.

Image Credit: Quantum Design, Inc.

Self-Sensing Cantilever

The electrical noise level of 0.32 Å for the self-sensing cantilever is equivalent to the optical noise level.

Image Credit: Quantum Design, Inc.

Image Credit:M. Dukic et al., Scientific Reports 5, 16393 (2015)

EFM Analysis of BaTiO₃ Ceramics

Investigate grain boundary interfaces and energy barriers as a function of silica content.

Image Credit: Quantum Design, Inc.

Silicon-rich phase shows a smaller energy barrier.

Image Credit: Prohinig et al., Scripta Materialia 214 (2022) 114646

Download the Brochure for More Information

Magnetic Properties of Duplex Steel

Utilize SEM to identify and map different magnetic domains on the surface of Duplex Steel.

Image Credit: Quantum Design, Inc.

Integrate SEM, EBSD, AFM topography, and MFM data for comprehensive correlative analysis.

Image Credit: Quantum Design, Inc.

Summary

FusionScope

An innovative method for interactive correlative research at the nanoscale that combines AFM and SEM.

Image Credit: Quantum Design, Inc.

Analyze Electrical Properties

Conduct in-situ EFM characterization at the BaTiO₃ grain boundaries.

Image Credit: Quantum Design, Inc.

Analyze Magnetic Properties

Conduct MFM characterization of duplex steel in situ.

Image Credit: Quantum Design, Inc.

Download the Brochure for More Information