Full-Sized Scanning Electron Microscope CX-200K

The CX-200K is a standard yet highly capable full-sized scanning electron microscope (SEM) designed for various research and quality control applications. Its brand-new, user-friendly NanoStation5 GUI facilitates easy and effective operation.

With a 500,000x maximum magnification, it provides exceptional high-resolution imaging. Users can experience faster, more optimal imagery and personalize the CX-200K to meet their unique needs with various customizable options.

The CX-200K raises the bar for simple yet effective microscopy by fusing cutting-edge technology with user-friendliness.

Key Specifications

Resolution: less than 3 nm

Magnification range: 9x to 500,000x

Standard BSE and SE detector

Accelerating Voltage: 1 - 30 kV

Five-axis stage

Chamber scope

Complete EDS/EBSD compatibility

Multiple ports for external analysis tools

标签：Scanning Electron Microscopes (SEM)

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