FT-IR Imaging and Microscopy: LUMOS II

In FT-IR microscopy, Bruker’s LUMOS II provides excellent spectral and visual data quality, together with complete automation of all measurement modes: ATR, transmission, and reflection. For both novice and expert FT-IR users, LUMOS II is the ideal infrared microscopy solution.

Using the special Focal Plane Array (FPA) detector technology from Bruker, users can experience detailed imaging at the highest speed. Thus, users can take complete advantage of the enormous possibilities that FT-IR microscopy has to offer.

With the OPUS IR software, users can be assessed at any time and can move effortlessly through analysis, measurement and reporting.

Advantages

TE-MCTrequires no liquid nitrogenformeasurements≥10 µm

Up to three detector positions (e.g. TE-MCT+LN-MCT+FPA)

FT-IR imagingat exceptional speedby FPA technology

More than 1000spatially resolvedIR spectra in a single scan

Completely automated FT-IR microscope

Built-in piezo-controlled ATR crystal

Samples with a height of up to 40 mm can be analyzed

Automated transmission, reflectionand ATR measurements

Evaluation and measurement are software-supported

Excellent spatial resolution and high-quality spectral data

FT-IR Microscopy and Imaging reimagined – This is the LUMOS IIPlay