FlexAFM: Flexible Research AFM

Researchers rely on professional tools to obtain success in their experimental studies as theyoffer the data required, irrespective of the ongoing tasks. Through progressing main technologies and designs, Nanosurf has made the FlexAFM one of the highly versatile and flexible AFMs ever.

This enables a vast range of research applications to be handled with comfort. Together with the strong C3000i controller, complicated material characterizations are possible.

Modular concept to precisely match user’s requirements

Flat and linear scanning as a result of flexure-based scanner technology

Consistent with inverted microscopes

True flexibility available with exchangeable cantilever holders for specialized tasks

Appropriate for any sample size

Scanning capabilities in liquid and latest measurement modes

We have been using the FlexAFM system for the last couple of years. The ease of use and its robustness helped us publish a number of articles in high impact journals. I'm very pleased with the performance of your AFM system and would highly recommend your systems for other customers in India and abroad. The technical support from Switzerland as well as local support in India is found to be very satisfactory.

Nitya Nand Gosvami, Professor, Department of Materials Science & Engineering, Indian Institute of Technology Delhi

Image Credit: Nanosurf AG

Practical Details That Really Matter in Daily Use

Cantilever holders with alignment structures are available for use with cantilevers that have alignment grooves. This offers circumventing laser alignment, micrometer repositioning accuracyand enables users to determine the same sample features repeatedly.

Entering the image in the cantilevers is from top to bottom, so sample orientation is frequently the same, no matter if users look by eye, CCD cameraor AFM (when scanned at the default scan angle).

Alignment chip technology. Image Credit: Nanosurf AG

Top view on stand-alone stage. Image Credit: Nanosurf AG

Top view on inverted microscope. Image Credit: O. Guilaume-Gentil, ETH Zürich, Switzerland.

FlexAFM Imaging Modes

This overview displays which modes the instrument is capable of. Some modes might need extra components or software options.

Standard Imaging Modes

Static force mode

Lateral force mode

Phase imaging mode

Dynamic force mode (tapping mode)

Thermal Imaging Modes

Scanning thermal microscopy (SThM)

Magnetic Properties

Magnetic force microscopy

Electrical Properties

Conductive AFM (C-AFM)

Surface potential

Electrostatic force microscopy (EFM)

Piezoelectric force microscopy (PFM)

Scanning spreading resistance microscopy (SSRM)

Kelvin probe force microscopy (KPFM)

Mechanical Properties

Force spectroscopy

Adhesion

Force modulation

Stiffness and modulus

Force mapping

Unfolding and stretching

Other Measurement Modes

Electrochemical AFM (EC-AFM)

Lithography and nanomanipulation

System Specifications

Table 1. FlexAFM 5 scan head specifications with C3000i controller.Source: Nanosurf AG

⁽¹⁾ Manufacturing tolerances ±5%⁽²⁾ Manufacturing tolerances ±10%⁽³⁾ Measured at 2 kHz⁽⁴⁾ Measured with XYContr cantilever

Table 2. C3000i controller — Core hardware specifications.Source: Nanosurf AG

Table 3. Cantilever. Source: Nanosurf AG

Scan Head Dimensions

Image Credit: Nanosurf AG