OSM-Z-100B - Objective Scanning Mechanism
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Among all the instruments in its class, the Thermo Scientific Prisma E Scanning Electron Microscope (SEM) offers the most comprehensive solution, thanks to its sophisticated automation and extensive range of imaging and analytical modalities.
It is perfect for applications that require high resolution, sample flexibility, and an intuitive operator interface, such as industrial research and development, quality control, and failure analysis. The Prisma E SEM succeeds the extremely popular Thermo Scientific Quanta SEM.
ESEM with EDS
The Prisma E SEM stands out due to its exceptional blend of versatile performance, an extensive array of accessories, and the most user-friendly elemental analysis offered by Thermo Scientific ColorSEM. This combination makes the Prisma E SEM the preferred choice for micro-scale imaging and analysis across various industries and fields.
Prisma E Scanning Electron Microscope Features
Elemental Information at the Fingertips
Live composition-based image coloring for intuitive elemental analysis with optional ChemiSEM Technology and integrated energy-dispersive X-Ray spectroscopy (EDS). Users can expedite theirwork and obtain the most comprehensive sample information thanks to always-on analysis.
Minimize Sample Preparation Time
Low vacuum and ESEM capability allow for charge-free imaging and analysis of nonconductive and/or hydrated specimens.
Excellent Analytical Capabilities
Outstanding analytical capabilities including wavelength-dispersive spectroscopy (WDS), coplanar EDS/EBSD, high-quality charge-free EDS and EBSD in low vacuum, and a chamber that supports three simultaneous EDS detectors and 180° opposite EDS ports.
Excellent Image Quality
Excellent image quality at low vacuum and low kV because of flexible vacuum modes, such as differential pumping via the lens. Simultaneoussecondary electron (SE) and backscattered electron (BSE) imaging in every mode of operation.
In-Situ Study of Materials in their Natural State
The environmental SEM (ESEM) mode on the Prisma E SEM allows samples to be scanned even if they are hot, dirty, outgassing or wet.
Easy to Use
Easy to use, intuitive software with user guidance and an undo function means that even novice users can achievehighly effective operationwhile enabling experts to do their work faster and with fewer mouse clicks.
Prisma E Scanning Electron Microscope Specifications
Source: Thermo Fisher Scientific – Electron Microscopy Solutions
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Resolution |
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Standard detectors |
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Optional detectors |
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ChemiSEM Technology (optional) |
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Stage bias (beam deceleration, optional) |
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Low vacuum mode |
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Stage |
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Standard sample holder |
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Chamber |
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In situaccessories (optional) |
Platinum Tungsten Carbon |
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Software options |
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