Electron Backscatter Diffraction (EBSD) EDAX APEX™ Software

EDAX APEX^™ EBSD is a user-friendly software platform that enables the characterization of electron cackscatter diffraction (EBSD) patterns.

Users can simply, quickly, and reliably collect high-quality data using strong pattern analysis and an accessible UI. APEX improves user productivity and provides the best option for microstructural characterization when combined with EDAX hardware.

Image Credit: Gatan

Ease of use

Intuitive operation for beginners and skilled users

Automatic optimization of EBSD detector and data collection parameters

Application tabs for analysis modes are set up, and each tab contains logical sets of suitable functions

Graphical ribbon bar permits rapid access to functions and features

APEX EBSD ribbon bar. Image Credit: Gatan

Adjustable layouts

The ability to rearrange and resize data view windows as desired by the user

Each application tab has a variety of layouts that display the appropriate view windows for the selected action

Users can choose from a variety of color schemes to suit their tastes or the scanning electron microscope (SEM) interface

Users can store and utilize customized layouts

Context-sensitive layout selection. Image Credit: Gatan

User customization

Windows^® Authentication for login if required

Single- or multi-user modes

Individual settings saved for each user

Features

Triplet Indexing engine

Sensitivity to rogue band detection is decreased by the novel three-bands (triplets) indexing technique

With Triplet Indexing, users can obtain excellent indexing success rates even at the fastest EDAX Velocity^™ EBSD detector speeds

The patented Confidence Index value provides a quantifiable evaluation of the quality of the crystallographic indexing solution

Improve band detection options on the dedicated Hough page to guarantee that all crystal structures are effectively indexed

Generate high-quality indexing results using real-world samples

Triplet Indexing resolves overlapping patterns for better indexing. Image Credit: Gatan

Comprehensive EBSD data collection

Automatic detector optimization for application-specific EBSD data collection

Automatic step size recommendations for efficient scanning

Multiple scan modes

Quickly gather each EBSD pattern or a comprehensive scan

Line scan acquisition

Hexagonal grid sampling for enhanced data sampling

Dynamic scanning

Data statistics summary

Hough band detection

Crystal unit cell display

Feedback gives users information on collection quality

During each scan, users can track and assess data collected in real-time with numerical and visual feedback

Combine grayscale and color maps to comprehend the results better

Grayscale maps incorporate image quality, SEM signal, and PRIAS™ (optional)

Color maps include IPF, Confidence Index, phase, and EDS elements

EBSD pattern and indexing display

Multiple scanning modes available. Image Credit: Gatan

Montage large area mapping

Scans wide areas with stage motions to collect data from multiple domains of study

Data is automatically stitched into a single file for thorough examination

Oversampling is possible to improve field matching

EBSD mapping example from a high entropy alloy weld. Image Credit: Gatan

Batch scanning

Compiles a sequence of scans into a single batch operation

Defines standard free-form, Montage, and line scans for a batch

Defines the batch’s simultaneous EDS, magnification, step size, scan area, and stage position

Enables the effective use of SEM for studying a variety of samples or locations

Data management

Default names within the project tree for rapid collection with the option to rename if needed

Can specify file name and location to match user requirements

HDF file well-matched with APEX Review for EDS analysis and EDAX OIM Analysis^™ for EBSD examination

Project tree structure for the seamless organization of data

HDF file format for data portability and management

64-bit software architecture for managing big data

Single file for both EBSD and EDS collection

Project tree data organization.Image Credit: Gatan

Integrated EDS-EBSD

Complete integration of energy dispersive x-ray spectroscopy (EDS/EDX) and EBSDfor thorough material characterization

Make use of the cutting-edge EDS quant engine, which has been optimized for high-tilt EBSD geometries

Correlation of structural and chemical information using an integrated EDS spectrum and EBSD pattern collection

Compatible with ChI-Scan™ processing for simultaneous EDS-EBSD scanning for increased multi-phase analysis

Advanced reporting

Report production that is customizable based on OIM Analysis user templates

Template files with default design templates contain user-defined report content

Personalized report layout with Report Designer tool

Use reporting with batch scanning capability

Users can generate reports using the APEX EBSD or OIM Analysis software