EDS on SEM - Fast Elemental Analysis for Electron Microscopes

The QUANTAX EDS system for SEM, FIB-SEM and EPMA is equipped with the fast, precise and reliable XFlash^® 7 detector – allowing users to rapidly and accurately carry out the elemental analysis of samples such as advanced materials, minerals, electronic components and more.

Reach an unmatched analytical throughout of up to 1,000,000 kps

Access a complete atomic database of more than 2,200 elemental lines to quantify even the most complex data

Collect data at the largest solid angle available, >1.1 sr, thanks to optimized geometry

The XFlash^®7 EDS detector series provides thelargest solid anglefor X-ray and thehighest throughput, setting standards for Scanning Electron Microscopy (SEM), Focused Ion Beam (FIB-SEM) and Electron Probe Microanalysis (EPMA).

The detector’s superior energy resolution helps users attain the highest spectral performance possible.

In addition to standard EDS detectors the XFlash^®FlatQUAD is also available and is perfectly suited for the analysis of beam-sensitive samples such as samples and biological materials. The XFlash^®FlatQUAD allows for measurement at a low keV and low beam current facilitating accurate, high-resolution elemental mapping of delicate samples.

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Make Elemental Analysis More Efficient

Seamless integration of four analytical methods - EDS, WDS, EBSD, and micro-XRF on SEM – in the ESPRIT software suite

Detect smallelemental quantities with a low detection limit

Benefit from accurate and reliable quantification results with the optimized geometry minimizing background noise and helping avoid unwanted absorption.

Gain very precise results faster with individually optimized EDS systems, ensuring unmatched speed and precision.

Shorten measurement time with maximized throughput, enabling mapping and quantification at all settings with no limitation of data size.

XFlash 7 - The latest EDS Detector Series for Electron MicroscopesPlay

Video Credit: Bruker Nano Analytics