EDAX Velocity EBSD Camera for Real-World Materials

EDAX’s Velocity™ EBSD Camera Series offers high-speed electron backscatter diffraction (EBSD) mapping and the most significant indexing performance on real-world materials. Velocity, powered by a CMOS sensor, combines quick acquisition with low noise performance and excellent sensitivity for optimal data collection and quality.

The Velocity Camera Series includes four distinct models:

Velocity Ultra—Up to 6,700 indexed points per second (ipps)

Velocity Super—Up to 4,500 ipps

Velocity Plus—Up to 3,000 ipps

Velocity Pro—Up to 2,000 ipps

These speeds are achievable for all models while maintaining indexing success rates of up to 99%. EDAX’s proven triplet indexing procedure provides orientation accuracy values of less than 0.1° without requiring any specific processing methods for accurately describing deformed microstructures.

EBSD orientation map from additively manufactured 316 L was collected at 6,700 ipps with Velocity Ultra with a 99% indexing success rate. Image Credit: Gatan

EBSD orientation map from additively manufactured Inconel 718 was collected at 4,500 ipps with Velocity Super with a 99% indexing success rate. Image Credit: Gatan

EBSD orientation map from Inconel 600 was collected at 3,000 ipps with Velocity Plus with a 99% indexing success rate. Image Credit: Gatan

EBSD orientation map from deformed brass was collected at 2,000 ipps with Velocity Pro with a 99% indexing success rate. Image Credit: Gatan

The performance of the Velocity camera extends to a wide range of materials, including multi-phase, poorer symmetry, and deformed structures. The Velocity Series enables effective data collection on such real-world samples while delivering the quality results necessary for optimum materials analysis.

The Velocity EBSD cameras have the ability to combine with reliable EDAX energy dispersive x-ray spectroscopy (EDS) detectors for efficient concurrent EDS-EBSD collection, even at high collection speeds. Combined with ChI-Scan™ analysis, this results in useful integrated data for exact phase differentiation.

Features and benefits

Data collection rates up to 6,700 ipps

EBSD maps are collected in minutes for efficient SEM usage, in-situ experimentation, and 3D EBSD applications.

Provides high sensitivity, low noise images for EBSD indexing at the highest speeds

Provides images with excellent sensitivity and minimal noise for EBSD indexing at high rates.

Orientation precision less than 0.1°

With standard indexing techniques, clear characterization of distorted microstructures is possible

High indexing success rates

EDAX’s triplet indexing and unique Confidence Index provide unparalleled indexing performance on challenging real-world samples.

High-speed simultaneous EDS–EBSD collection

The Velocity EBSD cameras have been enhanced with reliable EDAX EDS detectors available for effective data collection at the fastest rates.