EDAX OIM Analysis

EDAX OIM Analysis™ is the premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data. Analysis options include comprehensive grayscale and color mapping tools to display orientations, grain boundaries, phases, energy dispersive x-ray spectroscopy (EDS/EDX) information, and local deformation.

Most analysis results can be displayed in colorful, meaningful maps and quantified in charts and texture calculations. As all points in the data displays are linked to their measurement location in the map, interactive highlighting allows specific microstructural features to be investigated by displaying selected points in all other representations.

Significant new functionality has been introduced into the software, including:

Multithreading optimization to allow users to take advantage of modern computer technology

EBSD pattern reindexing to improve indexing performance away from the scanning electron microscope (SEM) with EDAX’s Triplet Indexing, ChI-Scan™, and NPAR™ technologies

OIM Matrix™ dynamic pattern simulation for dictionary indexing and structure file optimization

Anti-grain analysis for characterization of non-indexed datapoints

Correlation plots for understanding the relationship between different EBSD measurements metrics

Features and benefits

Multithreaded operations

Optimized code to take advantage of modern multi-core CPUs for faster map rendering, highlighting, and characterization calculations

EBSD pattern indexing

Ability to reindex points within an OIM mapping dataset

Reindexing by a point, a partition, or a complete dataset

ChI-Scan and NPAR indexing capability available

Batch reindexing for analysis of multiple datasets (3D and in-situ experiments)

Anti-grains analysis

Formation of ‘anti-grains’ from measurement points that are not included in traditional grain determination algorithm

Anti-grain size and shape can then be analyzed

Anti-grains can be correlated with porosity or amorphous phases

OIM Matrix

Dynamic diffraction-based EBSD pattern simulation

Dictionary indexing capability

Structure file and multi-phase background optimization

HDF5 support

Data and patterns stored in HDF5 format for improved data portability and management

Correlative microscopy

Import of spatially-specific measurements for visualization and correlative analysis