EDAX Octane Elect EDS System

The EDAX Octane Elect EDS system represents an enhanced energy dispersive X-ray spectroscopy (EDS/EDX) platform that incorporates the most recent developments in high-speed electronics and silicon drift detector (SDD) technology.

Tailored for users needing elevated functionality and performance beyond what entry-level systems can offer, it provides exceptional resolution and high throughput at a compelling value. Notably, it boasts unprecedented low-energy sensitivity for microanalysis at low voltage (kV) and excels in the detection of light elements.

Octane Elect silicon drift detectors

The Octane Elect SDDs come equipped with a manual slide, a silicon nitride (Si₃N₄) window, and high-speed electronics. Furthermore, they can seamlessly integrate with EDAX's electron backscatter diffraction (EBSD) cameras within the Pegasus (EDS-EBSD) system. This integration provides a user-friendly package for comprehensive analysis of both crystal structure and elemental composition.

The Octane Elect SDDs come in two models:

Octane Elect Plus - 30 mm² chip

Octane Elect Super - 70 mm² chip

Best light element performance

The Octane Elect SDD, with its Si₃N₄ window, offers substantial transmission improvements compared to detectors equipped with a polymer window. This enhancement leads to superior performance in the detection of light elements and delivers more crucial data for materials analysts.

Low kV performance

Silicon nitride's mechanical properties allow for the use of thinly fabricated windows with a support grid featuring a low aspect ratio. This configuration provides a significant advantage in terms of low energy sensitivity and optimal performance for low voltage analysis.

Spectra acquired from a silicon dioxide sample at 10 kV. The comparison of the scaled spectra to the Si K peak clearly shows the increased oxygen and carbon peak intensities achieved with a Si₃N₄ window. Image Credit: Gatan

Benefits

Optimized SDD electronics for stable energy at high collection rates

Optimized data quality across all count rates

Swift pulse processing for mapping and quantification tasks

High-resolution quantitative analysis at mapping speeds exceeding 400,000 cps

Throughput

Integrated with state-of-the-art detection electronics, EDAX EDS systems deliver the highest available throughput count rate on the market. This not only enhances productivity but also ensures the highest quality of analysis.

Al L to Al K peak height ratio of 1:1 at 2.5 kV. Image Credit: Gatan

Reliability

The design of the SDDs, combined with the durability and material properties of the Si₃N₄ window, results in the most reliable and robust detectors suitable for all EDS applications. Their unique module design makes them appropriate for plasma cleaning and resistant to shock and corrosion.

APEX™ EDS analysis software allows users to optimize their analysis time and get the best possible data from their sample

APEX guarantees high-quality, precise results and improved productivity through its user-friendly interface, real-time graphical display, and simultaneous review mode.

It comes standard with APEX^™ Analysis Software for EDS applications.

Additionally, EDAX Analysis Software is available for integrated EDS-EBSD applications.