EDAX EDS: Elite T Silicon Drift Detector

EDAX EDS is the most intriguing and practical analytical tool for scanning transmission electron microscope (STEM)applications.

Features:

The EDAX EDS powered by Gatan provides completely integrated data capture and signal processing, along with characteristics to aid in configuration and evaluation. The Elite T silicon drift detector optimizes light element performance and maximizes collection efficiency, while DigitalMicrograph^® (DM) software is the industry standard for TEM/STEM experimental analysis and control throughout a wide range of image analysis and analytical techniques.

This potential combination enables users to receive the best possible results in difficult conditions.

Elite T Silicon Drift Detector

Compact sensor geometry allows the user to get nearer to the sample, boosting solid angle and count rates for the rapid data collection on sensitive samples

Provides excellent resolution and minimal peak shift at all count rates for optimal deconvolution, as well as an extremely high count rate for quick mapping and time to data.

Employs a windowless design to get better sensitivity for low energies as low as Al L

DigitalMicrograph Software

Full DM integration offers a robust, multi-dimensional, one-stop analysis of data and visualization platform for all TEM/STEM applications

Allows users to customize the analysis with native support for DM scripting and Python programming

Makes use of fully customizable data capture and a single palette to accurately maintain and simplify all acquisition workflow: areas, lines, points, and time series

Multimodal capability combines all STEM data, such as energy dispersive spectroscopy (EDS), 4D STEM, electron energy loss spectroscopy (EELS), cathodoluminescence (CL), and imaging, on a unified platform