EDAX APEX Software for Electron Backscatter Diffraction (EBSD)

APEX^™ EBSD allows for the characterization of Electron Backscatter Diffraction (EBSD) patterns within the user-friendly APEX software platform.

The combination of powerful pattern analysis and an intuitive interface enables users to gather and report high-quality data easily, rapidly, and reliably. Coupled with EDAX hardware, the APEX increases users' productivity and offers the ideal solution for microstructural characterization.

Image Credit: EDAX

Ease of Use

Intuitive operation for beginners and skilled users

Automatic optimization of EBSD detector and data collection parameters

Analysis modes are arranged into application tabs with applicable functions fitted into logical groups in each tab

Graphical ribbon bar allows rapid access to functions and features

APEX EBSD ribbon bar. Image Credit: EDAX

Adjustable Layouts

Ability to resize and organize data view windows according to user preferences

Numerous layouts are available for each application tab that display applicable view windows for preferred operation

Color schemes can be selected by users to match user preferences or the scanning electron microscope (SEM) interface

Custom layouts can be saved and reused

Context sensitive layout selection. Image Credit: EDAX

User Customization

Single- or multi-user modes

Individual settings saved for each user

Windows^® Authentication for loginif required

Features

Triplet Indexing Engine

The innovative three-bands (triplets) indexing approach reduces sensitivity to rogue band detection

With Triplet Indexing, users can achieve high indexing success rates even at the highest available speeds of the Velocity^™ EBSD Detectors

The Patented Confidence Index value offers a quantitative quality measurement for the crystallographic indexing solution

Improve band detection settings on the devoted Hough page to ensure that all crystal structures are successfully indexed

Produce high-quality, indexing results on real-world samples

Triplet Indexing resolves overlapping patterns for better indexing. Image Credit: EDAX

Comprehensive EBSD Data Collection

Multiple scan modes

Effortlessly collect individual EBSD patterns or a full scan

Line scan acquisition

Hexagonal grid sampling for enhanced data sampling

Automatic detector optimization for application-specific EBSD data collection

Automatic step size recommendations for efficient scanning

Dynamic Scanning

Users can monitor and evaluate data collection in real time with numeric and visual feedback during each scan

Combine grayscale and color maps to better comprehend the results

Grayscale maps incorporate Image Quality, SEM signal, and PRIAS (optional)

Color maps include IPF, Confidence Index, Phase, and EDS Elements

EBSD pattern and indexing display

Data statistics summary

Hough band detection

Crystal Unit Cell display

Feedback gives users information on collection quality

Multiple scanning modes available. Image Credit: EDAX

Montage Large Area Mapping

Scans large areas using stage movements to gather various fields of analysis

Automatically stitches data into a single file for detailed analysis

Oversampling is available to enhance matching between fields

EBSD mapping example from a high entropy alloy weld. Image Credit: EDAX

Batch Scanning

Gathers a series of scans as a single batch process

Specifies typical free-form, Montage, and line scans for a batch

Specifies the simultaneous EDS, magnification, step size, scan area, and stage location within the batch

Allows efficient use of SEM for analyzing various samples or areas

Data Management

Project tree structure for the seamless organization of data

HDF file format for data portability and management

64-bit software architecture for managing big data

Single file for both EBSD and EDS collection

Default names within the project tree for rapid collection with the option to rename if needed

Can specify file name and location to match user requirements

HDF file well-matched with APEX Review for EDS analysis and OIM Analysis^™ for EBSD examination

Project tree data organization. Image Credit: EDAX

Integrated EDS-EBSD

Complete integration of Energy Dispersive Spectroscopy (EDS) and EBSD for detailed materials characterization

Utilize the innovative EDS quant engine that is enhanced for high-tilt EBSD geometries

Integrated EDS spectrum with EBSD pattern collection to correlate structural and chemical information

Simultaneous EDS-EBSD scanning compatible with ChI-Scan processing for enhanced multi-phase analysis

Advanced Reporting

Customizable report generation according to OIM Analysis user templates

User-defined report content is available in template files with default design templates

Personalized report layout with Report Designer tool

Use reporting with batch scanning capability

Users can create reports from APEX EBSD or OIM Analysis software