Click Plastics AG
We see ourselves as a matchmaker between the plastic processors (customers) and the plastic produ……...
The Phenom Pure Desktop Scanning Electron Microscope (SEM) from Thermo Scientific is a perfect tool that can help shift from light optical to electron microscopy. It is an inexpensive solution for high-resolution imaging and offers the best imaging outcomes in its class.
The durable and high-brightness CeB6 source enables the Phenom Pure Desktop SEM to offer high-quality images. Also, it ensures the market’s quickest loading and imaging time. The highly reliable autofocus and automated source alignments make this system the easiest to use in the market.
Key Features
Never-Lost Navigation
The user is always aware of the sample’s position thanks to the special never-lost navigation. Summaries of both the electron and optical images offer clear reference points. Users can navigate quickly via their sample with the help of the combined motorized stage.
Easy to Use
After only 10 minutes of basic training, users can readily capture images. A wide range of sample holders is provided to house a large array of samples. Sample loading is a rapid and safe process, thanks to the patented sample vacuum loading technology.
Customize SEM
The Phenom Pure Desktop SEM can be fitted with two optional detector systems. The first one is a completely integrated energy dispersive spectroscopy (EDS) system, and the second is a secondary electron detector (SED) used for applications that need surface and topography sensitive imaging.
Specifications
Source: Thermo Fisher Scientific – Electron Microscopy Solutions
. | . |
---|---|
Light optical magnification |
Fixed 27x |
Electron optical magnification range |
160–175,000x |
Resolution |
≤15 nm |
Digital zoom |
Max. 12x |
Light optical navigation camera |
Color |
Acceleration voltages |
Default: 5 kV and 10 kV |
Vacuum modes |
High vacuum mode Charge-reduction mode via optional low vacuum sample holder |
Detector |
Backscattered electron detector (standard) Energy-dispersive X-ray spectroscopy detector (optional) Secondary electron detector (optional) |
Sample size |
Up to 25 mm diameter 32 mm (optional) |
Sample height |
Up to 35 mm 100 mm (optional) |
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