Discover TESCAN TENSOR, the World’s First Integrated Analytical 4D-STEM

Electron beam precession and near-UHV enhance performance

Analytical 4D-STEM

The Full Picture of Electron Beam-Specimen Interaction

For true nanoscale, multimodal characterization of material properties like morphology, chemistry, and structure, 4D-STEM is the preferred microscopy technique. TESCAN TENSOR quickly and flawlessly synchronizes the acquisition of a diffraction pattern and an EDS spectrum at each pixel in the STEM dataset.

Diffraction and spectroscopy data together encapsulate the entire electron beam-specimen interaction, from which a wide range of material properties can be derived.

Near Real-Time Analysis and Processing of 4D-STEM Data

Explore - TENSOR’s integrated platform for real-time processing and analysis of large-scale scanning electron diffraction datasets -is a unique feature of the TESCAN TENSOR.

Without needing specialized knowledge of STEM optics, 4D-STEM data analysis, or post-processing, Explore makes 4D-STEM measurements accessible to material scientists, semiconductor researchers, and crystallographers.

For each STEM or 4D-STEM measurement, advanced users have the option to customize the preset optimized optical properties.

Additionally, advanced users who want to create their own 4D-STEM measurements can use open-source computational platforms like HyperSpy, LiberTEM, or Py4DSTEM as the 4D-STEM data obtained with the Virtual STEM measurement is compatible with them.

Differentiated 4D-STEM Performance

The ultrafast and accurate synchronization of scanning with (direct electron) diffraction imaging, EDS acquisition, electron beam precession, beam blanking, and real-time analysis and processing of the acquired data support the performance of TESCAN TENSOR’s 4D-STEM capabilities.

This was made possible by incorporating cutting-edge tools and methods “from the ground up:”

Precession Electron Diffraction (PED)

Real-time 4D-STEM analysis and processing (Explore)

Hybrid Pixel, Direct Electron Detection (DED)

Large solid angle, symmetrical, window-less EDS

Near-Ultra High Vacuum within the sample area (near-UHV)

Fast, integrated Beam Blanking

TESCAN TENSOR: A STEM That is as Easy to Use as an SEM

Long before the invention of the TEM, scientists, engineers, technicians, and students desired a TEM solution that could be used right away without requiring weeks or months of training on ineffective electron-optical adjustments and alignments.

With TESCAN TENSOR, users can interact with their sample while using the microscope rather than worrying about the optics. This is accomplished by putting into practice “measurements” that have preset optical characteristics like beam current, convergence angle, spot size, and precession ON or OFF that are automatically adjustedand aligned.

The end result is an analytical 4D-STEM that is as simple to use as TESCAN SEMs and has all the productivity and financial advantages of a results-drivenElectron Microscope.

This strategy could also offer financial advantages, such as improved tool usability for inexperienced users and a higher rate of return on investment.