Dimension Edge Atomic Force Microscope (AFM) from Bruker

The Dimension^® Edge™ Atomic Force Microscope (AFM) System offers access to the highest performance, accessibility and functionality in its class, by incorporating Bruker's PeakForce Tapping^® technology.

It leverages the many innovations of the Dimension® Icon® System, and is designed to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, you won’t find a more powerful mid-priced AFM anywhere else.

Features

Features of the Dimension Edge AFM from Bruker are outlined below.

Best Value Closed-Loop Dimension AFM

Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels

Reduced noise and drift bring small-sample imaging performance to large-sample AFM

Microscope and electronics design enable high image fidelity at moderate cost

Accurate, High-Resolution Results Even Faster

Linear workflow with visual feedback ensure optimized setup in shortest time

Camera and stage provide best sample navigation and multi-site measurements

Seamless transitions from survey to highest resolution deliver fast, accurate results

Solutions for All Applications on Any Sample

Open stage access accommodates wide variety of experiments and samples

Optimized AFM modes and techniques meet needs of even advanced applications

Built-in access to signal routing enables custom measurements

Advanced Nanoscale Capabilities For Beginners and Experts

Innovative, modular system design provides high performance at moderate cost

Experiment-selection modes distill decades of AFM expertise into preconfigured settings

Integrated stage control enables intuitive navigation and powerful stage programming