[db:国别翻译]美国ABQ Manufacturing Inc
/9-9-I-9M-9M-9-9A-9-9G-9G-9E-1/ 我们为多元化行业提供个性化的粉末涂料服务。 历史 总裁兼创始人布……...
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers access to the highest performance, accessibility and functionality in its class, by incorporating Bruker's PeakForce Tapping® technology.
It leverages the many innovations of the Dimension® Icon® System, and is designed to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, you won’t find a more powerful mid-priced AFM anywhere else.
Features
Features of the Dimension Edge AFM from Bruker are outlined below.
Best Value Closed-Loop Dimension AFM
Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels
Reduced noise and drift bring small-sample imaging performance to large-sample AFM
Microscope and electronics design enable high image fidelity at moderate cost
Accurate, High-Resolution Results Even Faster
Linear workflow with visual feedback ensure optimized setup in shortest time
Camera and stage provide best sample navigation and multi-site measurements
Seamless transitions from survey to highest resolution deliver fast, accurate results
Solutions for All Applications on Any Sample
Open stage access accommodates wide variety of experiments and samples
Optimized AFM modes and techniques meet needs of even advanced applications
Built-in access to signal routing enables custom measurements
Advanced Nanoscale Capabilities For Beginners and Experts
Innovative, modular system design provides high performance at moderate cost
Experiment-selection modes distill decades of AFM expertise into preconfigured settings
Integrated stage control enables intuitive navigation and powerful stage programming
/9-9-I-9M-9M-9-9A-9-9G-9G-9E-1/ 我们为多元化行业提供个性化的粉末涂料服务。 历史 总裁兼创始人布……...
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