DECTRIS ELA® Hybrid-Pixel Electron Detector

This DECTRIS ELA^® hybrid-pixel electron detector is fast and sensitive, making it ideal for EELS and 4D STEM data collection.

The DECTRIS ELA electron-counting detector provides best-in-class performance in terms of detector noise, frame rate, and dynamic range. It can withstand probe currents of more than 100 pA and catches weak and strong reflections, allowing for improved diffraction and imaging experiments. Furthermore, it enables rapid elemental mapping, which is essential when working with beam-sensitive materials.

Electron Energy Loss Spectroscopy (EELS) and Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM) are two applications for which the ELA hybrid-pixel detector is specially designed.

The ELA hybrid-pixel detector is specifically designed for applications such as Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM) and Electron Energy Loss Spectroscopy (EELS).

Captures everything: The ELA detector's dead-time-free readout captures all information available from the sample.

Fast: The ELA detector’s high frame and count rates substantially shorten experiment time while increasing instrument throughput

Simple: The ELA detector’s Application Programming Interface (API) allows for easy integration into any current data pipeline or electron microscopy suite

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Detector Specifications

Source: Dectris Ltd

Integrated Solutions

Gatan Stela Camera

This first fully integrated hybrid-pixel electron detector includes Gatan Microscopy Suite^® (GMS) software for sophisticated electron diffraction research.

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Nion IRIS EEL Spectrometer

With an exceptional energy resolution of 4 meV, this spectrometer has the highest energy resolution available on the market.

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CEOS CEFID

CEOS CEFID is ideal for Electron Energy Loss Spectroscopy (EELS) applications due to its low non-isochromaticity (NI), long-term stability, and consistency of optical alignments, which ensures superior energy resolution.

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Case Study

In a joint article in Ultramicroscopy, Nion and DECTRIS examined and described the DECTRIS ELA^® hybrid-pixel electron detector and its application possibilities.

Publication: Hybrid-pixel Direct Detector for Electron Energy Loss Spectroscopy, Ultramicroscopy Vol. 217, October 2020

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Techniques

Electron Energy Loss Spectroscopy (EELS)

Using the radiation-hard, high-dynamic-range electron detectors, userscan capture both the Zero-Loss Peak (ZLP) and the core-loss characteristics in the spectrum simultaneously.

Image Credit: Dectris Ltd

Fast Elemental Mapping

Using the highly fast hybrid-pixel detectors, users can perform elemental mapping almost in real time with minimum radiation damage to the material.

Image Credit: Dectris Ltd

Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM)

Use accurate and dependable electron-counting detectors to collect high-quality 4D STEM data.

Image Credit: Dectris Ltd