Coatings and Thin Film Characterization – GD-Profiler 2™

The GD-Profiler 2™ from HORIBA Scientific is designed for the characterization of coatings, surfaces and interfaces for applications such as ferrous and non-ferrous alloys, galvanization, nitriding, PVD/CVD coatings, paints, ceramics, glass, photovoltaic materials and energy storage, including Li-ion batteries.It offers fast elemental depth profiling for conductive and non-conductive materials, from the first nanometer down to 150 µm. All elements from Hydrogen to Uranium can be measured, including Nitrogen, Oxygen, Lithium and Fluorine. #

The GD-Profiler 2™ is powered by a patented radio-frequency source that can operate in pulsed mode and by a high-resolution simultaneous spectrometer. Many patented accessories are extending its capabilities to address more analytical challenges: direct thickness measurement, organic layers, air sensitive samples, rough samples, etc.

Key Features

Glow Discharge Source

Radio-frequency-generator for conductive and non-conductive samples

Patented pulsed mode operation to ensure integrity of fragile samples and avoid diffusion of light elements during sputtering

Double-pumping for optimal crater shape and accurate depth profile analysis

High-Resolution Spectrometer

Paschen-Runge polychromator using holographic ion-etched blazed grating and MgF2 components for optimal light transmission in the UV for the measurement of H, C, N, O and Cl

Spectral range from 110 to 800 nm to cover all elements, including H, N, O, K, Li and F

HDD detection for real-time optimized sensitivity: high sensitivity for low signals and extended dynamic range for intense signals with no compromise on the speed of acquisition

Unique Accessories

Differential Interferometry Profiling, DiP (patented) for direct measurement of crater depth, layer thickness and sputtering rate removing the need for sputtering rate tables

Ultra-Fast Sputtering, UFS (patented) allowing fast sputtering of polymer layers and the analysis of hybrid inorganic/organic samples with excellent depth resolution

Monochromator using holographic ion-etched holographic grating for addition of any element within a depth profile

Lithium bell (patented) for the analysis of air-sensitive samples

Special kits for special samples: non-flat, tubes, rods, small samples

Quantum™ Software

Multitasking and multilingual interface

Real-time display of signals and ultra-fast data treatment with multiple smoothing algorithms and automatic detection of interfaces

Intelligent quantification models

Multiple reports and exports formats