英国Leica Microsystems - Nanotechnology & EM Sample Preparation - EMEA
徕卡显微系统公司开发和制造用于分析微观结构和纳米结构的显微镜和科学仪器。 该公司因其光学精度和创新……...
CMI730 Contact Thickness Gauges
The CMl730® accepts multiple probe types to meet almost any PCB application, including surface copper, and through-hole applications. The CMl730® comes standard with the SRP-4 probe and an advanced statistical package for interpretation of test data. This instrument is highly-expandable, capable of both micro-resistance and eddy current testing for the accurate and precise measurement of copper. Optional accessories are available to measure thru-hole copper thickness.
Key Features
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