Camtek FRT Metrology

Camtek FRT Metrology manufactures 3D surface measurement technology for research and production. Our high-precision measuring instruments are based on SurfaceSens^TM multi-sensor concept and are equipped with in-house developed software.

The multiple award-winning measuring systems provide (also fully automatically) information about topography, step height, roughness, layer thickness and many other parameters, contact-free and non-destructive. Depending on the application, different measuring methods can be combined with point, line, area and layer thickness sensors and atomic force microscopy in one measuring instrument - measuring ranges can vary from meters to sub-nanometers. The Camtek FRT MicroProf® is well established in semiconductor front end, advanced packaging, MEMS, VCSEL, automotive, engineering and optics.

Camtek is a leading developer and manufacturer of high-end inspection and metrology equipment for the semiconductor industry. Camtek’s systems inspect and measure wafers throughout the production process of semiconductor devices, covering the front and mid-end, and up to the beginning of assembly (Post Dicing Inspection and Metrology).