Bruker Dimension Icon AFM with Integrated Confocal Micro-Raman System

Bruker’s Dimension Icon AFM (atomic force microscope) offers excellent resolution, reliability and productivity, whilst maintaining the highest level of expandability. With the advent of integrated Raman spectroscopy capability, the Dimension Icon sets a new benchmark in high-performance surface characterization.

A state-of-the-art confocal µ-Raman system together with the Dimension Icon system allows for co-localized measurements with unparalleled ease and efficiency, taking material characterization to a new level.

When it comes to integrated measurements, the Dimension Icon AFM-Raman proves its excellent productivity. With its sophisticated features, full complement of techniques and µ-Raman capabilities, the system is a perfect for examining the mechanisms underlying the effect of crystalline structure or chemical composition on relevant material properties.

Key Features

The main features of the Dimension Icon AFM-Raman are:

Excellent resolution

High performance

High productivity and reliability

Powerful microscopy overlay software

Complete AFM capabilities combined with sophisticated confocal Raman microscopy

Most comprehensive data utilizing the full range of extended AFM modes and spectroscopic techniques

Instant correlated AFM and µ-Raman research quality results

Integrated material and composition mapping on a single platform ensures optimum performance in sample characterization