Bettersizer S3 Plus - Particle Size and Shape Analyzer

Bettersize Instruments’ Bettersizer S3 Plus particle size and shape analyzer combines laser diffraction and dynamic image analysis in a single instrument.

This instrument can measure the size and shape of particles from 0.01 μm to 3500 μm. Its extraordinary sensitivity for ultrafine or oversized particles and unmatched resolution make this instrument the most powerful size and shape analysis option for researchers conducting first-class scientific research.

The Bettersizer S3 Plus offers a range of features and benefits, including:

A wide measurement range of 0.01 μm to 3500 μm (laser system) or 2 μm to 3500 μm (image system)

Laser diffraction and dynamic image analysis in a single instrument

The ability to simultaneously obtain size and shape results

A patented DLOI (Dual Lenses & Oblique Incidence) system able to measure ultrafine particles down to 0.01 μm

Dual-camera imaging technology able to display particle images in real-time, detecting oversized particles up to 3500 μm

Refractive index measurement able to determine the refractive index of unknown samples and improve results’ reliability

Full compliance with 21 CFR Part 11, ISO 13320, USP <429>, and CE standards

Bettersizer S3 Plus | Particle Size and Shape AnalyzerPlay

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Overview

The Bettersizer S3 Plus laser diffraction particle size and shape analyzer uses a pair of high-speed CCD cameras (0.5x and 10x magnification) to acquire images of the sample under investigation.

Particles are dispersed in the medium of choice before being pumped through two sample cells. In the first sample cell, short-wave laser light (532 nm) illuminates any particles present and is scattered before detection.

The instrument’s 96 detectors detect optical signals in an angle range of 0.02 ° to 165 °. Throughout this process, the CCD cameras continuously acquire images of particles through the second sample cell, allowing the instrument to provide accurate shape information in the range of 2 µm to 3500 µm.

Image Credit:Bettersize Instruments

Patented DLOI (Dual Lenses Oblique Incidence) System: Laser Diffraction

Many industrial sectors prefer laser diffraction technology for routine particle size analysis. The Bettersizer S3 Plus leverages the patented DLOI system (designed based on the Fourier structure) to ensure accurate measurement of ultrafine particles from 0.01 μm.

This powerful system offers a range of benefits, including:

A total of 96 detectors with the ability to measure ultrafine particles accurately

A large angular range of 0.02 ° to 165 °

A reliable dual-lens optical system with excellent resolution

A 532 nm single short-wave laser system offering a continuous scattering spectrum with a consistent wavelength

No need for stabilization and preheating time due to the system’s solid-state light source

Image Credit:Bettersize Instruments

Dual-Camera System: Dynamic Image Analysis

Dynamic image analysis improves understanding of materials, providing users with comprehensive shape or morphological data that is wholly independent of laser diffraction.

Individual particles can be effectively tracked through the dual-camera system, including those with specific geometric properties like crushed particles, agglomerates, and foreign particles.

This powerful system offers a range of benefits, including:

The ability to image a wide size range of particles with 0.5x and 10x cameras

The capacity to capture up to 10,000 particle images in 60 seconds via high-speed strobe lights, ensuring authentic shape results

Suitability for the measurement of heterogeneous samples possessing unknown optical properties

A Revolutionary Combination: Laser Diffraction with Dynamic Image Analysis

The Bettersizer S3 Plus can simultaneously characterize particle size, size distribution, and particle shape across an extensive dynamic range by integrating laser diffraction and dynamic image analysis into a single instrument.

By leveraging these two powerful techniques in tandem, users can gain a deeper insight into material behavior - key information for troubleshooting and expediting method development.

Key features and benefits include:

A powerful DLOI System able to precisely measure ultrafine particles as low as 0.01 μm

A dual-camera imaging system able to detect oversized particles up to 3500 μm

A truly two-in-one system able to simultaneously acquire particle size and shape data

A rapid time-to-result, typically generating results in just 10 seconds

Applications

The Bettersizer S3 Plus is suitable for use in a wide range of applications, including 3D printing materials, paints, inks, coatings, powder metallurgy, ceramics, food and beverages, pharmaceuticals, soils and sediments, batteries and energy, building materials, and abrasives.

Image Credit:Bettersize Instruments