Averaging EBSD Patterns With NPAR™ from EDAX

EDAX neighbor pattern averaging and reindexing (NPAR^™) is a technique used to determine the crystallographic orientation within electron backscatter diffraction (EBSD) patterns. The performance of band detection and indexing in EBSD patterns can sometimes be compromised due to high levels of noise, resulting in a low signal-to-noise ratio (SNR) in the data.

While reducing the detector gain to reduce noise or averaging multiple frames together can address these issues, they come with limitations. Both of these methods significantly increase the time required for pattern collection and orientation mapping.

EDAX's NPARtechnique involves averaging an EBSD pattern with neighboring patterns on the mapping grid before reindexing. This approach maintains the advantages of reduced noise and, consequently, a higher image SNR without the drawback of an extended pattern collection and orientation mapping time.

In essence, EDAX's indexing and band detection method empowers the EBSD detector to measure crystallographic orientation at very high gain levels, even in the presence of substantial noise, all while preserving indexing performance.

Feature highlights

High SNR within the pattern significantly boosts indexing performance.

There is no time penalty, as the pattern collection and orientation mapping remain very fast.

EBSD detectors can operate effectively at higher gain levels, even in the presence of noise, surpassing the capabilities of traditional detectors.

Rapid acquisition speed is maintained even at lower beam currents and voltages.

Particularly suitable for samples that are beam-sensitive and non-conductive.

Adaptable for a wide range of in-situ and 3D research experiments.