Widefield O-PTIR™: Sub-micron IR, Widefield Imaging for Fluorescent Samples
The new Widefield O-PTIR™is a sub-micron IR, high-speed widefield chemical imaging mode for……...
Aurora NanoDevices Inc.
Aurora NanoDevices Inc. supplies high quality, calibration systems for atomic force microscopy imaging. Founded in 2001, our systems are now found in hundreds of scanning probe microscopes through North American, Europe, and Japan.
Our main products are the Tipcheck and Nioprobe AFM imaging devices which have proven to be highly effective tip characterisation tools for deconvolving tip-surface interactions from the true surface image during atomic force microscopy scans.
Primary Activity
Material Manufacturer
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