Atomic Force Microscope (AFM): WITec alpha300 A

The alpha300 A Atomic Force Microscope from WITec is a versatile and powerful nano-imaging system integrated with a research-grade optical microscope. It offers easy cantilever alignment, superior optical accessand high-resolution sample survey.

WITec’s AFMs are designed and built to be combined with other imaging methods such as confocal Raman imaging andScanning Near-field Optical Microscopy. By simply rotating the microscope turret, the researchercan select from several techniques.

Whether users are working in air or liquid environments, or with fragile or soft samples, the alpha300 A is well suited toexamining topographic structures at the highest resolution. The system can be fitted with the advanced Pulsed Force Mode intermittent contact modulefor materials research imaging applications.

Other microscopy methods that can be incorporated with the AFM include fluorescence, polarization analysis, photoluminescence, anddark field and bright field imaging.

Key Features of the alpha300 A

Surface characterization on the nanoscale

Straightforwardsample access from all directions

Many available AFM modes

Convenient cantileverexchange and alignment

Can be used easily in liquids and air

Accurate TrueScan™ controlled scanning stages

Available integrationwith Scanning Near-field Optical Microscopy (SNOM) and confocal Raman imaging in a single microscope

AFM topography image of a steel surface.Image Credit:WITec GmbH

Digital Pulsed Force Mode image of fossilized bacteria. Image Credit: WITec GmbH

Magnetic Force Measurement of a hard drive disk. The measurements were performed using AC mode technique with magnetic tips. Image Credit: WITec GmbH