alpha300 R: Confocal Raman Imaging Microscope from WITec

WITec’salpha300 RconfocalRamanmicroscopeseries is widely consideredthe benchmarkin advanced Raman imaging systems. Continuousdevelopment driven by WITec’s innovative spirit keeps its range of capabilites at the industry's leading edge.

The alpha300 R offers unequalled speed, sensitivity, and resolution. These advantages are available simultaneously and without compromise, which allows the quick investigation of even weak Raman scatterers and extremely low material concentrations or volumes with the the lowest excitation energy. Optimized optics and mechanical components enableRaman spectra to be recorded at each image pixel with acquisition times on the order of milliseconds.

Due to the confocal setup, it is not only possible to collect information from the sample'ssurface, but also to look deep inside transparent samples andobtain 3D information indepth scans and image stacks.When analyzing dedicated peak characteristics of the spectra, a variety of images can be generated using only a single set of data. This allowsthe distribution of chemical compounds, crystallinity, or material stress properties to be visualized.In addition to the imaging capabilities, the system can also be used to collect Raman spectra at selected sample areas and along arbitrary lines or to acquire time series.

The inherent modularity of the makes it possible to combine Raman imagingwithcomplementary imaging methods including AFM, SNOM and SEM,and allows it to evolve with changing experimentalrequirements.Applications include materials science, coating and thin film analysis, semiconductor research,geoscience, pharmaceutics, food science and many others.

Key Features of the alpha300 R

• Confocal Raman imaging with unmatched performance in sensitivity, speed, and resolution

• Industry-leading lateral resolution

• Hyperspectral image generation through the acquisition ofa complete Raman spectrum at every image pixel

• Ultra-fast Raman imaging available with below 1 ms integration time per spectrum

• Non-destructive imaging method: Staining or specialized sample preparation unnecessary

• Ultra-high throughput spectroscopic system for maximum sensitivity and outstanding spectral resolution

• Exceptional depth resolution ideally suited to 3D image generation and depth profiles

  

  Confocal 3D Raman volume image of a pharmaceutical emulsion. The oil phase (green) is partially removed in the image for better visibility of the silicon impurities (red) in the water and API containing phase (blue). Image Credit: WITec GmbH

  Material stress in silicon imaged via Raman peak-shift analysis. Tensile strain (blue) and compressive strain (yellow). Image Credit: WITec GmbH

  3D Raman image of a fluid inclusion in garnet. Image Credit: WITec GmbH