Advanced Microscopy, SPM, AFM and SEM Image Processing - SPIP™ Software

SPIP™ is a professional software package that provides industrial and academic researchers with an advanced toolkit for working with microscope images, profiles and force curve data, including correcting and noise reduction, analysis and inspection, visualization and reporting of analysis results.

Strongly rooted in metrology, SPIP™ is known for its resulting analysis and processing accuracy and detail. Comprehensive visualization tools allow adjustment and personalization of image presentations, and the customizable automation tools ensure efficiency and productivity for the user.

SPIP™ supports many microscope types including scanning probe microscopes (SPM, AFM, STM, SNOM, etc.), electron microscopes (SEM, TEM), interference microscopes, confocal microscopes, optical microscopes, and profilers along with their file formats.

SPIP™ can be configured to individual user needs by selecting an appropriate package or by selecting individual features with the desired functionality. SPIP™ can be handled with ease by both skilled researchers and amateurs.

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Main Features of SPIP^™

Correction and Enhancement

Plane correction (flattening)

Spatial filtering and FFT filtering

Interpolation of bad lines or bad points

Tip characterization and deconvolution

Image / curve arithmetic

XY linearity analysis and correction

XY and Z calibration

Pixels to micron scaling of SEM and TEM images

Mirror and rotation

Image alignment

..and much more

Inspection and Analysis

Particle & Pore Analysis incl. Classification

Roughness Analysis (ISO standards)

Hardness indent analysis

Histogram analysis

Void and material volume analysis

Cross correlation and Correlation Averaging

Fourier transform analysis (FFT)

Linearity analysis

Gradient and integral images

Cross-section profile analysis

Interactive measure tool analysis

Zoom and pan

Area of Interest analysis

Contrast enhancement

Force curve analysis incl. modulus calculation and wlc fitting

IV (CITS) curve analysis incl. density of state calculation etc.

Time lapse movies

..and much more

Visualization

2D images with optional scale bar

3D projection with image overlay

Windowed or full screen view

Customize colours, fonts and line widths for publication or presentation

Define custom colour scales

Print or export to graphics formats

..and much more

Ease of use and productivity

Modern adaptive ribbon based interface

Multi curve analysis, e.g. force curves or roughness profiles

Synchronization of tools across images

Scripting functionality

Batch processing of many files

Templated reporting

User functions via plug-in interface

Automatically open new files in a monitored folder

Integration with third party programs via command line

Examples of Functions in SPIP™ Version 6

Particle & pore analysis applied to various types of particles, pores and grainsClassify particles or poresTrace fibers and measure distances using particle analysis and profiling toolsUse area of interest masks and cross sections for analysis and processingCreate 3D projections and animation movies for your presentationsEnhance structures using correlation averagingRemove noise using one of many filters in SPIP™Analyse force curves: Critical events, Hertz/DMT/JKR models, WLC models, etc.Calculate modulus maps and analyse curves from force volume imagesAnalyse the roughness of images or profiles according to various standardsCharacterize your tip and de-convolute your imagesCalibrate and correct your microscope imagesFilter or analyse structures using FFT spectrum analysisInspect or aalyse IV curves and CITS images